Skip to main content

Improving Memory Reliability against Soft Errors Using Block Parity

P. Reviriego, C. Argyrides, J. A. Maestro, Dhiraj Pradhan, Improving Memory Reliability against Soft Errors Using Block Parity. IEEE Transactions on Nuclear Sciences, 58(3). June 2011. No electronic version available.

Abstract

Bibtex entry.

Publication Admin