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Reliability Aware Yield Improvement Technique for Nanotechnology Based Circuits

Costas Argyrides, Giorgos Dimosthenous, Carlos Lisboa, Luigi Carro, Dhiraj Pradhan, Reliability Aware Yield Improvement Technique for Nanotechnology Based Circuits. 22nd annual symposium on Integrated circuits and system design SBCCI a??09. July 2009. No electronic version available.

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