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Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set

Jimson Mathew, H. Rahaman, Dhiraj Pradhan, Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set. 13th IEEE International On-Line Testing Symposium,Greece. June 2007. No electronic version available.

Abstract

We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. SynopsysA? tool is used to generate ATPG based test patterns.

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